Cita APA (7a ed.)
Hackler, R. A., McAnally, M. O., Schatz, G. C., Stair, P. C., & Van Duyne, R. P. (2017). Identification of Dimeric Methylalumina Surface Species during Atomic Layer Deposition Using Operando Surface-Enhanced Raman Spectroscopy. Journal of the American Chemical Society, 139(6), 2456-2464.
Cita Chicago Style (17a ed.)
Hackler, Ryan A., Michael O. McAnally, George C. Schatz, Peter C. Stair, y Richard P. Van Duyne. "Identification of Dimeric Methylalumina Surface Species During Atomic Layer Deposition Using Operando Surface-Enhanced Raman Spectroscopy." Journal of the American Chemical Society 139, no. 6 (2017): 2456-2464.
Cita MLA (9a ed.)
Hackler, Ryan A., et al. "Identification of Dimeric Methylalumina Surface Species During Atomic Layer Deposition Using Operando Surface-Enhanced Raman Spectroscopy." Journal of the American Chemical Society, vol. 139, no. 6, 2017, pp. 2456-2464.
Precaución: Estas citas no son 100% exactas.