Henkel, J., & Montuschi, P. (2017). Computer Engineers' Challenges for the Next Decade: The Triangle of Power Density, Circuit Degradation, and Reliability. Computer (00189162), 50(7), 12-13.
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Cita Chicago Style (17a ed.)
Henkel, Jorg, y Paolo Montuschi. "Computer Engineers' Challenges for the Next Decade: The Triangle of Power Density, Circuit Degradation, and Reliability."
Computer (00189162) 50, no. 7 (2017): 12-13.
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Cita MLA (9a ed.)
Henkel, Jorg, y Paolo Montuschi. "Computer Engineers' Challenges for the Next Decade: The Triangle of Power Density, Circuit Degradation, and Reliability."
Computer (00189162), vol. 50, no. 7, 2017, pp. 12-13.
Copiado correctamente al portapapeles
Error al copiar al portapapeles
Precaución: Estas citas no son 100% exactas.