Filali, W., Boubaaya, M., Garoudja, E., Lekoui, F., Abdellaoui, I., Amrani, R., . . . Sengouga, N. (2023). Artificial intelligence approach to analyze SIMS profiles of B, P and As in n- and p-type silicon substrates: Experimental investigation. Zeitschrift für Naturforschung Section A: A Journal of Physical Sciences, 78(12), 1143-1152.
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Chicago Style (17th ed.) Citation
Filali, Walid, Mohamed Boubaaya, Elyes Garoudja, Fouaz Lekoui, Ibrahime Abdellaoui, Rachid Amrani, Slimane Oussalah, and Nouredine Sengouga. "Artificial Intelligence Approach to Analyze SIMS Profiles of B, P and As in N- and P-type Silicon Substrates: Experimental Investigation."
Zeitschrift Für Naturforschung Section A: A Journal of Physical Sciences 78, no. 12 (2023): 1143-1152.
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MLA (9th ed.) Citation
Filali, Walid, et al. "Artificial Intelligence Approach to Analyze SIMS Profiles of B, P and As in N- and P-type Silicon Substrates: Experimental Investigation."
Zeitschrift Für Naturforschung Section A: A Journal of Physical Sciences, vol. 78, no. 12, 2023, pp. 1143-1152.
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Warning: These citations may not always be 100% accurate.