Wang, X., Uhlemann, F., Borgert, J., Chaduvula, S., Tellis, R., Frydrychowicz, A., . . . Amthor, T. (2024). Analysis and predictability of technologists' perception of MR exam complexity. Radiography, 30(1), 151-159.
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Cita Chicago Style (17a ed.)
Wang, X., F. Uhlemann, J. Borgert, S.C Chaduvula, R. Tellis, A. Frydrychowicz, J. Barkhausen, y T. Amthor. "Analysis and Predictability of Technologists' Perception of MR Exam Complexity."
Radiography 30, no. 1 (2024): 151-159.
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Cita MLA (9a ed.)
Wang, X., et al. "Analysis and Predictability of Technologists' Perception of MR Exam Complexity."
Radiography, vol. 30, no. 1, 2024, pp. 151-159.
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