Cita APA (7a ed.)
Hyett, G., Green, M., & Parkin, I. P. (2006). X-ray Diffraction Area Mapping of Preferred Orientation and Phase Change in TiO Thin Films Deposited by Chemical Vapor Deposition. Journal of the American Chemical Society, 128(37), 12147-12156.
Cita Chicago Style (17a ed.)
Hyett, Geoffrey, Mark Green, y Ivan P. Parkin. "X-ray Diffraction Area Mapping of Preferred Orientation and Phase Change in TiO Thin Films Deposited by Chemical Vapor Deposition." Journal of the American Chemical Society 128, no. 37 (2006): 12147-12156.
Cita MLA (9a ed.)
Hyett, Geoffrey, et al. "X-ray Diffraction Area Mapping of Preferred Orientation and Phase Change in TiO Thin Films Deposited by Chemical Vapor Deposition." Journal of the American Chemical Society, vol. 128, no. 37, 2006, pp. 12147-12156.
Precaución: Estas citas no son 100% exactas.