Schafer, D., Squier, J. A., Van Maarseveen, J., Bonn, D., Bonn, M., & Müller, M. (2008). In Situ Quantitative Measurement of Concentration Profiles in a Microreactor with Submicron Resolution Using Multiplex CARS Microscopy. Journal of the American Chemical Society, 130(35), 11592-11594.
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Cita Chicago Style (17a ed.)
Schafer, Dawn, Jeff A. Squier, Jan Van Maarseveen, Daniel Bonn, Mischa Bonn, y Michiel Müller. "In Situ Quantitative Measurement of Concentration Profiles in a Microreactor with Submicron Resolution Using Multiplex CARS Microscopy."
Journal of the American Chemical Society 130, no. 35 (2008): 11592-11594.
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Cita MLA (9a ed.)
Schafer, Dawn, et al. "In Situ Quantitative Measurement of Concentration Profiles in a Microreactor with Submicron Resolution Using Multiplex CARS Microscopy."
Journal of the American Chemical Society, vol. 130, no. 35, 2008, pp. 11592-11594.
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