Cita APA (7a ed.)
Steinhauer, C., Forthmann, C., Vogelsang, J., & Tinnefeld, P. (2008). Superresolution Microscopy on the Basis of Engineered Dark States. Journal of the American Chemical Society, 130(50), 16840-16842.
Cita Chicago Style (17a ed.)
Steinhauer, Christian, Carsten Forthmann, Jan Vogelsang, y Philip Tinnefeld. "Superresolution Microscopy on the Basis of Engineered Dark States." Journal of the American Chemical Society 130, no. 50 (2008): 16840-16842.
Cita MLA (9a ed.)
Steinhauer, Christian, et al. "Superresolution Microscopy on the Basis of Engineered Dark States." Journal of the American Chemical Society, vol. 130, no. 50, 2008, pp. 16840-16842.
Precaución: Estas citas no son 100% exactas.