Cita APA (7a ed.)
Koo, S. M., & Shin, H. K. (2026). Robustness and Reliability of SiC MOSFET Devices, SiC MOSFET Power Modules. Trans Tech Publications Ltd.
Cita Chicago Style (17a ed.)
Koo, Sang Mo, y Hoon Kyu Shin. Robustness and Reliability of SiC MOSFET Devices, SiC MOSFET Power Modules. Trans Tech Publications Ltd, 2026.
Cita MLA (9a ed.)
Koo, Sang Mo, y Hoon Kyu Shin. Robustness and Reliability of SiC MOSFET Devices, SiC MOSFET Power Modules. Trans Tech Publications Ltd, 2026.
Precaución: Estas citas no son 100% exactas.