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Reliability of landmark identification on monitor-displayed lateral cephalometric images.

Published in:American Journal of Orthodontics & Dentofacial Orthopedics Vol. 133; no. 6; pp. 790.e1 - 7901
Main Authors: Yu SH, Nahm DS, Baek SH
Format: research Journal Article
Published: Elsevier B.V. Jun2008
Online Access:View this record in EBSCOhost
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      dt: Jun2008
      vid: 133
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      pub: Elsevier B.V.
      place: New York, New York
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        atl: Reliability of landmark identification on monitor-displayed lateral cephalometric images.
      aug:
        au:
          Yu SH
          Nahm DS
          Baek SH
        affil: Department of Orthodontics, School of Dentistry, Seoul National University, Seoul, Korea.
      sug:
        subj:
          Cephalometry Standards
          Computer Graphics
          Computer Terminals
          Image Processing, Computer Assisted
          X-Ray Film
          Analysis of Variance
          Cephalometry Methods
          Observer Bias
          Radiography, Dental, Digital
          Reproducibility of Results
          Human
      pubtype: Academic Journal
      doctype:
        research
        Journal Article
      ougenre: Article
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    language: English
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