Individual IOL Surface Topography Analysis by the WaveMaster Reflex UV.

Purpose. In order to establish inspection routines for individual intraocular lenses (IOLs), their surfaces have to be measured separately. Currently available measurement devices lack this functionality. The purpose of this study is to evaluate a new topography measurement device based on wavefront...

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Publicado en:BioMed Research International Vol. 2013; pp. 363742 - 363743
Autores principales: Kannengießer, Marc, Langenbucher, Achim, Janunts, Edgar
Formato: research Journal Article
Publicado: Wiley-Blackwell 2013
Acceso en línea:Ver este registro en EBSCOhost
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      dt: 2013
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      pub: Wiley-Blackwell
      place: Malden, Massachusetts
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        10.1155/2013/363742
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        atl: Individual IOL Surface Topography Analysis by the WaveMaster Reflex UV.
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        au:
          Kannengießer, Marc
          Langenbucher, Achim
          Janunts, Edgar
        affil: Department of Experimental Ophthalmology, Saarland University, Kirrberger Straße 100, 66424 Homburg, Germany.
      sug:
        subj:
          Corneal Topography Methods
          Lenses, Intraocular
          Algorithms
          Human
          ROC Curve
          Surface Properties
      ab: Purpose. In order to establish inspection routines for individual intraocular lenses (IOLs), their surfaces have to be measured separately. Currently available measurement devices lack this functionality. The purpose of this study is to evaluate a new topography measurement device based on wavefront analysis for measuring individual regular and freeform IOL surfaces, the "WaveMaster Reflex UV" (Trioptics, Wedel, Germany). Methods. Measurements were performed on IOLs with increasingly complex surface geometries: spherical surfaces, surfaces modelled by higher-order Zernike terms, and freeform surfaces from biometrical patient data. Two independent parameters were measured: the sample's radius of curvature (ROC) and its residual (difference of sample topography and its best-fit sphere). We used a quantitative analysis method by calculating the residuals' root-mean-square (RMS) and peak-to-Valley (P2V) values. Results. The sample's best-fit ROC differences increased with the sample's complexity. The sample's differences of RMS values were 80 nm for spherical surfaces, 97 nm for higher-order samples, and 21 nm for freeform surfaces. Graphical representations of both measurement and design topographies were recorded and compared. Conclusion. The measurements of spherical surfaces expectedly resulted in better values than those of freeform surfaces. Overall, the wavefront analysing method proves to be an effective method for evaluating individual IOL surfaces.
      pubtype: Academic Journal
      doctype:
        research
        Journal Article
      ougenre: Article
    language: English
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