A Survey of the Use of Iterative Reconstruction Algorithms in Electron Microscopy.
One of the key steps in Electron Microscopy is the tomographic reconstruction of a three-dimensional (3D) map of the specimen being studied from a set of two-dimensional (2D) projections acquired at the microscope. This tomographic reconstruction may be performed with different reconstruction algori...
| Publicado en: | BioMed Research International Vol. 2017; pp. 1 - 18 |
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| Autores principales: | , , , , , , , , , , , , |
| Formato: | equations & formulas review Journal Article |
| Publicado: |
Wiley-Blackwell
9/17/2017
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| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=ccm&AN=125187543&site=ehost-live header: @attributes: shortDbName: ccm uiTerm: 125187543 longDbName: CINAHL Complete uiTag: AN controlInfo: bkinfo: dissinfo: jinfo: jid: 23146133 FT2T jtl: BioMed Research International issn: 23146133 maglogo: N pubinfo: dt: 9/17/2017 vid: 2017 pid: 480 pub: Wiley-Blackwell place: Malden, Massachusetts artinfo: ui: 125187543 125187543 125187543 10.1155/2017/6482567 125187543 ppf: 1 ppct: 17 formats: fmt: @attributes: type: P tig: atl: A Survey of the Use of Iterative Reconstruction Algorithms in Electron Microscopy. aug: au: Sorzano, C. O. S. Vargas, J. Otón, J. de la Rosa-Trevín, J. M. Vilas, J. L. Kazemi, M. Melero, R. del Caño, L. Cuenca, J. Conesa, P. Gómez-Blanco, J. Marabini, R. Carazo, J. M. affil: Centro Nacional de Biotecnología, CSIC, c/Darwin 3, Cantoblanco, 28049 Madrid, Spain sug: subj: Microscopy, Electron Surveys Algorithms Imaging, Three-Dimensional Tomography Image Processing, Computer Assisted Mathematics ab: One of the key steps in Electron Microscopy is the tomographic reconstruction of a three-dimensional (3D) map of the specimen being studied from a set of two-dimensional (2D) projections acquired at the microscope. This tomographic reconstruction may be performed with different reconstruction algorithms that can be grouped into several large families: direct Fourier inversion methods, back-projection methods, Radon methods, or iterative algorithms. In this review, we focus on the latter family of algorithms, explaining the mathematical rationale behind the different algorithms in this family as they have been introduced in the field of Electron Microscopy. We cover their use in Single Particle Analysis (SPA) as well as in Electron Tomography (ET). pubtype: Academic Journal doctype: equations & formulas review Journal Article ougenre: Article language: English refInfo: holdings: @attributes: islocal: N |
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