ROLE OF RADIOFREQUENCY POWER ON THE CRYSTALLOGRAPHIC, MORPHOLOGICAL AND OPTICAL PROPERTIES OF SPUTTERED ALUMINUM THIN FILMS.

Aluminum (Al) thin films are of great interest for applications in telecommunications, microelectronics, and the automotive industry, among others, due to their high conductivity, excellent optical properties and low weight. Their properties depend on the depositition technique and its parameters. I...

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Publicado en:	Revista Cubana de Física Vol. 42; no. 2; pp. 113 - 120
Autores principales:	RAMOS-BLAZQUEZ, R., SOLIS-POMAR, F., FUNDORA-CRUZO, A., COLLADO-HERNANDEZ, A., GARCIA-RODRIGUEZ, C., MARTÍNEZ-CARREÓN, M. J., MARTINEZ-HUERTA, A. FRAGIEL A., PEREZ-TIJERINA, E.
Formato:	Artículo
Publicado:	Universidad de La Habana 12/15/2025
Materias:	Aluminum films Magnetron sputtering X-ray diffraction Optical properties Morphology Crystallography Scanning electron microscopy Ultraviolet-visible spectroscopy
Acceso en línea:	Ver este registro en EBSCOhost