COMPUTING WITH A TRILLION CRUMMY COMPONENTS.
This article explores the objective of building defect and fault-tolerant circuits on the nanometer scale. The author compares the built-in downtime and multiple runs needed to test data in the early days of computing and how John von Neumann and Claude Shannon introduced the concept of machines tha...
| Publicado en: | Communications of the ACM Vol. 50; no. 9; pp. 35 - 40 |
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| Autores principales: | , , , |
| Formato: | Artículo |
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Association for Computing Machinery
Sep2007
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=26899790&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 26899790 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00010782 ACM jtl: Communications of the ACM issn: 00010782 maglogo: N pubinfo: dt: Sep2007 vid: 50 iid: 9 pid: 68 pub: Association for Computing Machinery artinfo: ui: 26899790 10.1145/1284621.1284644 ppf: 35 ppct: 5 formats: tig: atl: COMPUTING WITH A TRILLION CRUMMY COMPONENTS. aug: au: Robinett, Warren Snider, Gregory S. Kuekes, Philip J. Williams, R. Stanley affil: Computer Architect, Quantum Sciences Research Group, Hewlett-Packard Labs, Palo Alto, CA. Senior Fellow, Quantum Sciences Research Group, Hewlett-Packard Labs, Palo Alto, CA. su: Computer input-output equipment Von Neumann, John, 1903-1957 Complementary metal oxide semiconductors Nanostructured materials Principal components analysis Fault-tolerant computing Computer reliability Self-stabilization (Computer science) sug: subj: Computer input-output equipment Von Neumann, John, 1903-1957 Complementary metal oxide semiconductors Nanostructured materials Principal components analysis Fault-tolerant computing Computer reliability Self-stabilization (Computer science) ab: This article explores the objective of building defect and fault-tolerant circuits on the nanometer scale. The author compares the built-in downtime and multiple runs needed to test data in the early days of computing and how John von Neumann and Claude Shannon introduced the concept of machines that would work perfectly despite defective or unreliable components. Integrated circuitry achieved almost flawless precision, but miniaturizing circuits has brought the question of reliability back around to the components. How nanoscale parameters can complement CMOS development is discussed referencing Moore's Law rates of improvement while using only modest improvements in transistors. pubtype: Periodical doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2007 holdings: @attributes: islocal: N |
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