Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry
'X-ray diffractometry (XRD), a nondestructive technique, is an essential scientific tool capable of supplying users with fundamental data and information unobtainable by other techniques, and exhibits increasing usages and attracts intensive attention in modern science and technology. The complete c...
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| Formato: | Libro |
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Bentham Science Publishers
2011
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| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=3506185&site=ehost-live header: @attributes: shortDbName: nlebk uiTerm: 3506185 longDbName: eBook Collection (EBSCOhost) uiTag: AN controlInfo: bkinfo: btl: Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry aug: au: Cong, Qiuzi Yu, Xiang He, Li isbn: 9781608056255 9781608050765 imageinfo: pubinfo: dt: @attributes: year: 2011 month: 01 day: 01 dtAvail: @attributes: year: 2023 month: 03 day: 13 pub: Bentham Science Publishers pubContract: Bentham Science Publishers Ltd. place: [Sharjah, U.A.E.] price: 0.01 limitsGroup: maxCheckoutDays: 1500 pda: N printPagesOffline: 100 printPagesOnline: 100 previewPages: 10000 prePubGroup: dewey: @attributes: class: 571.457 item: 571 .457 lc: @attributes: class: QC482.D5 item: QC 482 .D5 artinfo: ui: 3506185 822891227 formats: fmt: @attributes: type: EB doid: NL$3506185$PDF caption: PDF download: Y tig: atl: Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry ptl: Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry aug: au: Cong, Qiuzi Yu, Xiang He, Li su: X-rays--Diffraction X-rays--Diffraction--Mathematical models sug: subj: SCIENCE / Physics / Crystallography X-rays--Diffraction X-rays--Diffraction--Mathematical models ab: 'X-ray diffractometry (XRD), a nondestructive technique, is an essential scientific tool capable of supplying users with fundamental data and information unobtainable by other techniques, and exhibits increasing usages and attracts intensive attention in modern science and technology. The complete cognition of many potentialities of XRD, however, requires an elementary knowledge of crystallography and X-ray science. Admittedly, certain routine applications of X-ray diffraction demand only little or no familiarity with this field, but most researchers want to go beyond these push-button applications and to use various techniques as powerful aids in both pure and applied research. This e-book aims at: (1) revealing theories and applicable skills of the novel two-dimensional and threedimensional (2D/3D) X-ray diffractometry for the structure characterization of material by providing an intuitive understanding of the description of instruments and methods, as well as a set of general mathematical models; (2) bridging present gaps between the basic texts and the specialist works. Based on asymmetrical-Bragg diffraction geometry which contains basic elements, a set of universal mathematical model has been built up, where two equations on the desired azimuth angle and a common scan mode are included. Compared with the previous literature, unique characters of this technique are: (1) multifunction; (2) simplicity of measurement; (3) depth/azimuth-resolved X-ray patterns for coatings; (4) texture measurement (rather than in the pole-figure method); and (5) profile analysis for size-strain broadening (not in the fitted - profile method). In addition, by reading the corresponding chapters it is possible to obtain many applications in five main fields. pubtype: eBook doctype: Book ougenre: Book language: English copyright: @attributes: flag: N copyrightText: holdings: @attributes: islocal: N |
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