Phthalimide-Based Polymers for High Performance Organic Thin-Film Transistors.
The article reports on the synthesis and characterization of two new thiophene copolymers with backbone phthalimide units. According to the authors, the thin-film optical and wide-angle X-ray diffraction (XRD) measurements have showed extended electronic conjugation and close intermolecular π-stacki...
| Publicado en: | Journal of the American Chemical Society Vol. 131; no. 21; pp. 7206 - 7208 |
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| Autores principales: | , , , |
| Formato: | Artículo |
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American Chemical Society
6/3/2009
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=41893831&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 41893831 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00027863 ACS jtl: Journal of the American Chemical Society issn: 00027863 maglogo: N pubinfo: dt: 6/3/2009 vid: 131 iid: 21 pid: 997 pub: American Chemical Society artinfo: ui: 41893831 10.1021/ja810050y ppf: 7206 ppct: 2 formats: tig: atl: Phthalimide-Based Polymers for High Performance Organic Thin-Film Transistors. aug: au: Xugang Guo Felix Sunjoo Kim Jenekhe, Samson A. Watson, Mark D. affil: Department of Chemistry, University of Kentucky, Lexington, Kentucky 40506-0055 Department of Chemical Engineering and Department of Chemistry, University of Washington, Seattle, Washington 98195-1750 su: Thiophenes Copolymers Thin films Transistors X-ray diffraction sug: subj: Thiophenes Copolymers Thin films Transistors X-ray diffraction ab: The article reports on the synthesis and characterization of two new thiophene copolymers with backbone phthalimide units. According to the authors, the thin-film optical and wide-angle X-ray diffraction (XRD) measurements have showed extended electronic conjugation and close intermolecular π-stacking for both polymers. Moreover, it is noted that the ambient carrier mobility of thin-film transistors prepared from these polymers is as high as 0.28 cm2/(V s). pubtype: Academic Journal doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2009 holdings: @attributes: islocal: N |
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