SiC Application and SiC Devices Reliability and Stability
Special topic volume with invited peer-reviewed papers only
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| Formato: | Libro |
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Trans Tech Publications Ltd
2025
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| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=4317614&site=ehost-live header: @attributes: shortDbName: nlebk uiTerm: 4317614 longDbName: eBook Collection (EBSCOhost) uiTag: AN controlInfo: bkinfo: btl: SiC Application and SiC Devices Reliability and Stability aug: au: Victor Veliadis Arash Salemi isbn: 9783036409160 9783036419169 imageinfo: pubinfo: dt: @attributes: year: 2025 month: 01 day: 01 pub: Trans Tech Publications Ltd pubContract: Trans Tech Publications, Ltd place: BAECH price: 0.01 limitsGroup: maxCheckoutDays: 1500 pda: N printPagesOffline: 100 printPagesOnline: 100 previewPages: 10000 artinfo: ui: 4317614 1549623321 formats: fmt: @attributes: type: EB doid: NL$4317614$PDF caption: PDF download: Y tig: atl: SiC Application and SiC Devices Reliability and Stability ptl: SiC Application and SiC Devices Reliability and Stability aug: au: Victor Veliadis Arash Salemi su: Physics Mining engineering Manufactures Engineering Electrical engineering Chemistry Chemical engineering sug: subj: TECHNOLOGY & ENGINEERING / Materials Science / General TECHNOLOGY & ENGINEERING / Electronics / General TECHNOLOGY & ENGINEERING / Manufacturing Physics Mining engineering Manufactures Engineering Electrical engineering Chemistry Chemical engineering ab: Special topic volume with invited peer-reviewed papers only pubtype: eBook doctype: Book ougenre: Book language: English copyright: @attributes: flag: N copyrightText: holdings: @attributes: islocal: N |
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