| Sumario: | On November 5, 2004, at the International Conference on Digital Printing Technologies in Salt Lake City, Utah, breakthrough anti-counterfeiting technology will be unveiled that may help track down the digital forgers who, because there is no way to trace documents forged on desktop publishing systems back to their source, have so far evaded the law. The approaches of researchers involved—George Chiu, Jan Allebach, and Edward Delp, three anti-counterfeiting engineers based at Indiana's Purdue University—differ slightly, but all are based on the use of computer programs to detect and analyze imperfections in the print quality of documents.
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