Three-Dimensional Packing Structure and Electronic Properties of Biaxially Oriented Poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) Films.

We use a systematic approach that combines experimental X-ray diffraction (XRD) and computational modeling based on molecular mechanics and two-dimensional XRD simulations to develop a detailed model of the molecular-scale packing structure of poly(2,5-bis (3-tetradecylthiophene-2-yl)thieno[3,2-b]th...

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Publicado en:Journal of the American Chemical Society Vol. 134; no. 14; pp. 6177 - 6191
Autores principales: Eunkyung Cho, Risko, Chad, Dongwook Kim, Gysel, Roman, Miller, Nichole Cates, Breiby, Dag W., McGehee, Michael D., Toney, Michael F., Kline, R. Joseph, Bredas, Jean-Luc
Formato: Artículo
Publicado: American Chemical Society 4/11/2012
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Acceso en línea:Ver este registro en EBSCOhost
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      dt: 4/11/2012
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      pub: American Chemical Society
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        10.1021/ja210272z
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        atl: Three-Dimensional Packing Structure and Electronic Properties of Biaxially Oriented Poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) Films.
      aug:
        au:
          Eunkyung Cho
          Risko, Chad
          Dongwook Kim
          Gysel, Roman
          Miller, Nichole Cates
          Breiby, Dag W.
          McGehee, Michael D.
          Toney, Michael F.
          Kline, R. Joseph
          Bredas, Jean-Luc
        affil:
          School of Chemistry and Biochemistry and Center for Organic Photonics and Electronics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States
          School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, United States
          Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
          Department of Physics, Norwegian University of Science and Technology, Høgskoleringen 5, N-7491 Trondheim, Norway
          Stanford Synchrotron Radiation Lightsource, Menlo Park, California 94025, United States
          Polymers Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
      su:
        Polymer film analysis
        X-ray diffraction
        Organic electronics
        Thiophenes
        Thin film crystallography
      sug:
        subj:
          Polymer film analysis
          X-ray diffraction
          Organic electronics
          Thiophenes
          Thin film crystallography
      ab: We use a systematic approach that combines experimental X-ray diffraction (XRD) and computational modeling based on molecular mechanics and two-dimensional XRD simulations to develop a detailed model of the molecular-scale packing structure of poly(2,5-bis (3-tetradecylthiophene-2-yl)thieno[3,2-b]thiophene) (PBTTT-C) films. Both uniaxially and biaxially aligned films are used in this comparison and lead to an improved understanding of the molecular-scale orientation and crystal structure. We then examine how individual polymer components (i.e., conjugated backbone and alkyl side chains) contribute to the complete diffraction pattern, and how modest changes to a particular component orientation (e.g., backbone or side-chain tilt) influence the diffraction pattern. The effects on the polymer crystal structure of varying the alkyl side-chain length from C to C and C are also studied. The accurate determination of the three-dimensional polymer structure allows us to examine the PBTTT electronic band structure and intermolecular electronic couplings (transfer integrals) as a function of alkyl side-chain length. This combination of theoretical and experimental techniques proves to be an important tool to help establish the relationship between the structural and electronic properties of polymer thin films.
      pubtype: Academic Journal
      doctype: Article
      src: R
    language: English
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