A High-Resolution Look at Glass Delamination Using Transmission Electron Microscopy (TEM).

Detalles Bibliográficos
Publicado en:American Laboratory Vol. 45; no. 4; pp. 27 - 30
Autor principal: Schumacher, Elaine F.
Formato: pictorial tables/charts Journal Article
Publicado: CompareNetworks, Inc. Apr2013
Acceso en línea:Ver este registro en EBSCOhost
fields @attributes:
  recordID: 1
pdfLink:
plink: https://search.ebscohost.com/login.aspx?direct=true&db=ccm&AN=87039477&site=ehost-live
header:
  @attributes:
    shortDbName: ccm
    uiTerm: 87039477
    longDbName: CINAHL Complete
    uiTag: AN
  controlInfo:
    bkinfo:
    dissinfo:
    jinfo:
      jid:
        00447749
        R3X
      jtl: American Laboratory
      issn: 00447749
      maglogo: N
    pubinfo:
      dt: Apr2013
      vid: 45
      iid: 4
      pid: 12339
      pub: CompareNetworks, Inc.
      place: San Francisco, California
    artinfo:
      ui:
        87039477
        104273160
        104273160
        87039477
      ppf: 27
      ppct: 3
      formats:
        fmt:
          @attributes:
            type: P
      tig:
        atl: A High-Resolution Look at Glass Delamination Using Transmission Electron Microscopy (TEM).
      aug:
        au: Schumacher, Elaine F.
      sug:
        subj:
          Microscopy, Electron Methods
          Glass
          Drug Packaging
          Drug Contamination
      pubtype: Academic Journal
      doctype:
        pictorial
        tables/charts
        Journal Article
      ougenre: Article
      ab:
    language: English
    refInfo:
    holdings:
      @attributes:
        islocal: N