X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns.

This paper presents a fast and efficient method for classifying X-ray images using random forests with proposed local wavelet-based local binary pattern (LBP) to improve image classification performance and reduce training and testing time. Most studies on local binary patterns and its modifications...

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Detalles Bibliográficos
Publicado en:Journal of Digital Imaging Vol. 24; no. 6; pp. 1141 - 1152
Autores principales: Ko, Byoung, Kim, Seong, Nam, Jae-Yeal
Formato: diagnostic images equations & formulas research tables/charts Journal Article
Publicado: Springer Nature Dec2011
Acceso en línea:Ver este registro en EBSCOhost