X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns.
This paper presents a fast and efficient method for classifying X-ray images using random forests with proposed local wavelet-based local binary pattern (LBP) to improve image classification performance and reduce training and testing time. Most studies on local binary patterns and its modifications...
| Published in: | Journal of Digital Imaging Vol. 24; no. 6; pp. 1141 - 1152 |
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| Main Authors: | , , |
| Format: | diagnostic images equations & formulas research tables/charts Journal Article |
| Published: |
Springer Nature
Dec2011
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| Online Access: | View this record in EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=ccm&AN=104596122&site=ehost-live header: @attributes: shortDbName: ccm uiTerm: 104596122 longDbName: CINAHL Complete uiTag: AN controlInfo: bkinfo: dissinfo: jinfo: jid: 08971889 DOQ jtl: Journal of Digital Imaging issn: 08971889 maglogo: N pubinfo: dt: Dec2011 vid: 24 iid: 6 pid: 237 pub: Springer Nature place: New York, New York artinfo: ui: 104596122 67104980 10.1007/s10278-011-9380-3 NLM21487837 104596122 ppf: 1141 ppct: 11 formats: fmt: @attributes: type: P tig: atl: X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns. aug: au: Ko, Byoung Kim, Seong Nam, Jae-Yeal affil: Department of Computer Engineering, Keimyung University, Shindang-dong Dalseo-gu Daegu 704-701 South Korea sug: subj: X-Rays Classification Decision Support Techniques Human Automation Algorithms Comparative Studies Validation Studies ab: This paper presents a fast and efficient method for classifying X-ray images using random forests with proposed local wavelet-based local binary pattern (LBP) to improve image classification performance and reduce training and testing time. Most studies on local binary patterns and its modifications, including centre symmetric LBP (CS-LBP), focus on using image pixels as descriptors. To classify X-ray images, we first extract local wavelet-based CS-LBP (WCS-LBP) descriptors from local parts of the images to describe the wavelet-based texture characteristic. Then we apply the extracted feature vector to decision trees to construct random forests, which are an ensemble of random decision trees. Using the random forests with local WCS-LBP, we classified one test image into the category having the maximum posterior probability. Compared with other feature descriptors and classifiers, the proposed method shows both improved performance and faster processing time. pubtype: Academic Journal doctype: diagnostic images equations & formulas research tables/charts Journal Article ougenre: Article language: English refInfo: holdings: @attributes: islocal: N |
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