Contribution of Metal Defects in the Assembly Induced Emission of Cu Nanoclusters.

Aggregation/assembly induced emission (AIE) has been observed for metal nanoclusters (NCs), but the origin of the enhanced emission is not fully understood, yet. In this work, the significant contribution of metal defects on AIE is revealed by engineering the self-assembly process of Cu NCs using et...

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Publicado en:	Journal of the American Chemical Society Vol. 139; no. 12; pp. 4318 - 4322
Autores principales:	Zhennan Wu, Huiwen Liu, Tingting Li, Jiale Liu, Jun Yin, Mohammed, Omar F., Bakr, Osman M., Yi Liu, Bai Yang, Hao Zhang
Formato:	Artículo
Publicado:	American Chemical Society 3/29/2017
Materias:	Copper Metal clusters Nanochemistry Clustering of particles Charge transfer
Acceso en línea:	Ver este registro en EBSCOhost