Contribution of Metal Defects in the Assembly Induced Emission of Cu Nanoclusters.

Aggregation/assembly induced emission (AIE) has been observed for metal nanoclusters (NCs), but the origin of the enhanced emission is not fully understood, yet. In this work, the significant contribution of metal defects on AIE is revealed by engineering the self-assembly process of Cu NCs using et...

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Bibliographic Details

Published in:	Journal of the American Chemical Society Vol. 139; no. 12; pp. 4318 - 4322
Main Authors:	Zhennan Wu, Huiwen Liu, Tingting Li, Jiale Liu, Jun Yin, Mohammed, Omar F., Bakr, Osman M., Yi Liu, Bai Yang, Hao Zhang
Format:	Article
Published:	American Chemical Society 3/29/2017
Subjects:	Copper Metal clusters Nanochemistry Clustering of particles Charge transfer
Online Access:	View this record in EBSCOhost