Computer Engineers' Challenges for the Next Decade: The Triangle of Power Density, Circuit Degradation, and Reliability.

This installment of Computer's series highlighting the work published in IEEE Computer Society journals comes from IEEE Transactions on Computers.

Bibliographic Details
Published in:	Computer (00189162) Vol. 50; no. 7; pp. 12 - 13
Main Authors:	Henkel, Jorg, Montuschi, Paolo
Format:	Article
Published:	IEEE Jul2017
Subjects:	Computer engineering Interface circuits Reliability in engineering Institute of Electrical & Electronics Engineers Hardware
Online Access:	View this record in EBSCOhost

Description
Summary:	This installment of Computer's series highlighting the work published in IEEE Computer Society journals comes from IEEE Transactions on Computers.