Generalizing Access to Instrumentation Embedded in a Semiconductor Device.
Despite the success of IEEE 1687, it has one significant shortcoming: it's difficult to use on devices without an 1149.1 test access port controller. IEEE P1687.1 addresses this problem.
| Publicado en: | Computer (00189162) Vol. 50; no. 7; pp. 92 - 96 |
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| Autores principales: | , , |
| Formato: | Artículo |
| Publicado: |
IEEE
Jul2017
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=124027627&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 124027627 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00189162 PUT jtl: Computer (00189162) issn: 00189162 maglogo: N pubinfo: dt: Jul2017 vid: 50 iid: 7 pid: 13605 pub: IEEE artinfo: ui: 124027627 10.1109/MC.2017.186 ppf: 92 ppct: 4 formats: tig: atl: Generalizing Access to Instrumentation Embedded in a Semiconductor Device. aug: au: Crouch, Al Laisne, Michael Keim, Martin affil: Southern Methodist University Dialog Semiconductor Mentor Graphics--A Siemens Company su: Embedded computer systems Semiconductor devices Computer systems Computer access control IEEE Computer Society sug: subj: Embedded computer systems Semiconductor devices Computer systems Computer access control IEEE Computer Society keyword: embedded computing hardware history of computing IEEE 1687 IEEE P1687.1 IJTAG internal JTAG Joint Test Action Group JTAG on-chip network on-chip resources semiconductor standards TAP test access port ab: Despite the success of IEEE 1687, it has one significant shortcoming: it's difficult to use on devices without an 1149.1 test access port controller. IEEE P1687.1 addresses this problem. pubtype: Academic Journal doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2017 holdings: @attributes: islocal: N |
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