Generalizing Access to Instrumentation Embedded in a Semiconductor Device.

Despite the success of IEEE 1687, it has one significant shortcoming: it's difficult to use on devices without an 1149.1 test access port controller. IEEE P1687.1 addresses this problem.

Bibliographic Details
Published in:	Computer (00189162) Vol. 50; no. 7; pp. 92 - 96
Main Authors:	Crouch, Al, Laisne, Michael, Keim, Martin
Format:	Article
Published:	IEEE Jul2017
Subjects:	Embedded computer systems Semiconductor devices Computer systems Computer access control IEEE Computer Society
Online Access:	View this record in EBSCOhost

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