Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques.
A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivit...
| Publicado en: | International Scholarly Research Notices pp. 1 - 10 |
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| Autores principales: | , |
| Formato: | equations & formulas research tables/charts Journal Article |
| Publicado: |
Wiley-Blackwell
2015
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| Acceso en línea: | Ver este registro en EBSCOhost |
| Sumario: | A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivity and magnetic permeability of conductor-backed and in situ materials. This paper performs an error analysis of the impact on wavefront curvature on a Free-space method called the two-thickness method. This paper compares the extracted electric and magnetic permeability computed with a plane wave versus a line source for a low-loss dielectric andmagnetic radar absorbingmaterial. These steps are conducted for TE andTMplane waves and electric andmagnetic line sources. |
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