Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques.

A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivit...

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Published in:International Scholarly Research Notices pp. 1 - 10
Main Authors: Fenner, Raenita A., Rothwell, Edward J.
Format: equations & formulas research tables/charts Journal Article
Published: Wiley-Blackwell 2015
Online Access:View this record in EBSCOhost
fields @attributes:
  recordID: 1
pdfLink:
plink: https://search.ebscohost.com/login.aspx?direct=true&db=ccm&AN=125673824&site=ehost-live
header:
  @attributes:
    shortDbName: ccm
    uiTerm: 125673824
    longDbName: CINAHL Complete
    uiTag: AN
  controlInfo:
    bkinfo:
    dissinfo:
    jinfo:
      jid:
        23567872
        JWZI
      jtl: International Scholarly Research Notices
      issn: 23567872
      maglogo: N
    pubinfo:
      dt: 2015
      pid: 480
      pub: Wiley-Blackwell
      place: Malden, Massachusetts
    artinfo:
      ui:
        125673824
        125673824
        125673824
        10.1155/2015/657254
        125673824
      ppf: 1
      ppct: 9
      formats:
        fmt:
          @attributes:
            type: P
      tig:
        atl: Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques.
      aug:
        au:
          Fenner, Raenita A.
          Rothwell, Edward J.
        affil: Loyola University Maryland, Baltimore, MD 21210, USA
      sug:
        subj:
          Materials Testing
          Electricity
          Magnetic Fields
          Permeability
      ab: A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivity and magnetic permeability of conductor-backed and in situ materials. This paper performs an error analysis of the impact on wavefront curvature on a Free-space method called the two-thickness method. This paper compares the extracted electric and magnetic permeability computed with a plane wave versus a line source for a low-loss dielectric andmagnetic radar absorbingmaterial. These steps are conducted for TE andTMplane waves and electric andmagnetic line sources.
      pubtype: Academic Journal
      doctype:
        equations & formulas
        research
        tables/charts
        Journal Article
      ougenre: Article
    language: English
    refInfo:
    holdings:
      @attributes:
        islocal: N