USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.
A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crys...
| Publicado en: | Revista Cubana de Física Vol. 41; no. 1; pp. 16 - 22 |
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| Autores principales: | , , |
| Formato: | Artículo |
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Universidad de La Habana
7/15/2024
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=lth&AN=178803022&site=ehost-live header: @attributes: shortDbName: lth uiTerm: 178803022 longDbName: MedicLatina uiTag: AN controlInfo: bkinfo: jinfo: jid: 02539268 UEW jtl: Revista Cubana de Física issn: 02539268 maglogo: N pubinfo: dt: 7/15/2024 vid: 41 iid: 1 pid: 21208 pub: Universidad de La Habana artinfo: ui: 178803022 ppf: 16 ppct: 6 formats: fmt: @attributes: type: P size: 903KB tig: atl: USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES. aug: au: RODRÍGUEZ-HERRERA, D. M. PENTON-MADRIGAI, A. ESTEVEZ-RAMS, E. affil: Department of Physics and Engineering Physics, University of Saskatchewan, Saskatoon SK S7N 5E2, Canada Facultad de Física - IMRE, Universidad de La Habana, Cuba su: Crystal structure Diffraction patterns Set functions X-ray diffraction sug: subj: Crystal structure Diffraction patterns Set functions X-ray diffraction ab: A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crystalline structure affected by planar defects. It allows the correlation length (AC) to be calculated, which describes the degree of disorder in this type of crystalline structure. The obtained result is validated through the Warren-Averbach method for microstructural analysis. Se presenta un formalismo matemaÍ tico para el caÍ lculo del perfil intrínseco de un máximo de difracción a través de un proceso de convolucioÍ n usando un conjunto de funciones lineales por intervalos. Este proceso de convolucioí n es implementado en el formalismo para la solucioí n directa de un patroí n de difraccioín de una estructura cristalina de capas afectada por defectos planares. Este procedimiento permite calcular la longitud de correlacion (AC), cantidad que describe el grado de desorden en este tipo de estructuras cristalinas. El resultado obtenido es validado a traveís del metodo de Warren - Averbach para el analisis microestructural. pubtype: Academic Journal doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y custom: Copyright of Revista Cubana de Física is the property of Universidad de La Habana and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. item: Revista Cubana de Física holder: Universidad de La Habana dt: @attributes: year: 2024 holdings: @attributes: islocal: N |
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