USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.

A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crys...

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Detalles Bibliográficos

Publicado en:	Revista Cubana de Física Vol. 41; no. 1; pp. 16 - 22
Autores principales:	RODRÍGUEZ-HERRERA, D. M., PENTON-MADRIGAI, A., ESTEVEZ-RAMS, E.
Formato:	Artículo
Publicado:	Universidad de La Habana 7/15/2024
Materias:	Crystal structure Diffraction patterns Set functions X-ray diffraction
Acceso en línea:	Ver este registro en EBSCOhost