Automating Postsilicon Debugging and Repair.
The article examines an automated process for the postsilicon error detection and verification of semiconductors in the integrated circuit manufacturing process. Due to the increasing complexity of semiconductor design, debugging has become the most time-consuming part of the manufacturing process,...
| Publicado en: | Computer (00189162) Vol. 41; no. 7; pp. 47 - 55 |
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| Autores principales: | , , |
| Formato: | Artículo |
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IEEE
Jul2008
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=33376052&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 33376052 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00189162 PUT jtl: Computer (00189162) issn: 00189162 maglogo: N pubinfo: dt: Jul2008 vid: 41 iid: 7 pid: 13605 pub: IEEE artinfo: ui: 33376052 10.1109/MC.2008.212 ppf: 47 ppct: 8 formats: tig: atl: Automating Postsilicon Debugging and Repair. aug: au: Kai-Hui Chang Markov, Igor L. Bertacco, Valeria affil: Senior member of technical staff, Avery Design Systems. Associate professor of electrical engineering and computer science, University of Michigan, Ann Arbor. su: Reduced instruction set computers Solid state electronics Semiconductor software Semiconductor defects Semiconductors testing Integrated circuit verification sug: subj: Reduced instruction set computers Solid state electronics Semiconductor software Semiconductor defects Semiconductors testing Integrated circuit verification ab: The article examines an automated process for the postsilicon error detection and verification of semiconductors in the integrated circuit manufacturing process. Due to the increasing complexity of semiconductor design, debugging has become the most time-consuming part of the manufacturing process, a particular problem due to the time-sensitive nature of the product. The methodology of the automated process is given. pubtype: Academic Journal doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2008 holdings: @attributes: islocal: N |
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