Automating Postsilicon Debugging and Repair.

The article examines an automated process for the postsilicon error detection and verification of semiconductors in the integrated circuit manufacturing process. Due to the increasing complexity of semiconductor design, debugging has become the most time-consuming part of the manufacturing process,...

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Bibliographic Details

Published in:	Computer (00189162) Vol. 41; no. 7; pp. 47 - 55
Main Authors:	Kai-Hui Chang, Markov, Igor L., Bertacco, Valeria
Format:	Article
Published:	IEEE Jul2008
Subjects:	Reduced instruction set computers Solid state electronics Semiconductor software Semiconductor defects Semiconductors testing Integrated circuit verification
Online Access:	View this record in EBSCOhost