Robustness and Reliability of SiC MOSFET Devices, SiC MOSFET Power Modules

Special topic volume with invited peer-reviewed papers only

Detalles Bibliográficos
Autores principales: Sang Mo Koo, Hoon Kyu Shin
Formato: Libro
Publicado: Trans Tech Publications Ltd 2026
Materias:
Acceso en línea:Ver este registro en EBSCOhost
Descripción
Sumario:Special topic volume with invited peer-reviewed papers only