Back-side inspection.

Jeffrey Kash and James Tsang at IBM's Watson Research Centre in Yorktown Heights, New York, have developed a method that can be used to inspect how well specific logic gates, the individual elements that do the arithmetic in a computer, are actually functioning. They do this by searching for tiny f...

Descripción completa

Detalles Bibliográficos
Publicado en:Economist Vol. 346; pp. 79 - 80
Formato: Artículo
Publicado: Economist Newspaper Limited January 24 1998
Acceso en línea:Ver este registro en EBSCOhost
Descripción
Sumario:Jeffrey Kash and James Tsang at IBM's Watson Research Centre in Yorktown Heights, New York, have developed a method that can be used to inspect how well specific logic gates, the individual elements that do the arithmetic in a computer, are actually functioning. They do this by searching for tiny flashes of light that the gates emit as they open and close. Flushed with this early achievement, Kash and Tsang are considering a more revolutionary way of using the switching luminescence. Their new method, called picosecond imaging circuit analysis, involves capturing separate pulses of light with an ultrafast detector, so that the switching of specific gates can be recorded and then replayed in slow motion for examination.