Back-side inspection.
Jeffrey Kash and James Tsang at IBM's Watson Research Centre in Yorktown Heights, New York, have developed a method that can be used to inspect how well specific logic gates, the individual elements that do the arithmetic in a computer, are actually functioning. They do this by searching for tiny f...
| Publicado en: | Economist Vol. 346; pp. 79 - 80 |
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| Formato: | Artículo |
| Publicado: |
Economist Newspaper Limited
January 24 1998
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| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=ssf&AN=507621067&site=ehost-live header: @attributes: shortDbName: ssf uiTerm: 507621067 longDbName: Social Sciences Full Text (H.W. Wilson) uiTag: AN controlInfo: bkinfo: jinfo: jid: 00130613 ECO jtl: Economist issn: 00130613 maglogo: N pubinfo: dt: January 24 1998 vid: 346 pid: 161 pub: Economist Newspaper Limited artinfo: ui: 507621067 ppf: 79 ppct: 1 formats: tig: atl: Back-side inspection. aug: su: Gate array circuits sug: subj: Gate array circuits ab: Jeffrey Kash and James Tsang at IBM's Watson Research Centre in Yorktown Heights, New York, have developed a method that can be used to inspect how well specific logic gates, the individual elements that do the arithmetic in a computer, are actually functioning. They do this by searching for tiny flashes of light that the gates emit as they open and close. Flushed with this early achievement, Kash and Tsang are considering a more revolutionary way of using the switching luminescence. Their new method, called picosecond imaging circuit analysis, involves capturing separate pulses of light with an ultrafast detector, so that the switching of specific gates can be recorded and then replayed in slow motion for examination. pubtype: Periodical doctype: Article src: R language: English refInfo: copyright: @attributes: flag: N holdings: @attributes: islocal: N |
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