4D Scanning Ultrafast Electron Microscopy: Visualization of Materials Surface Dynamics.
The continuous electron beam of conventional scanning electron microscopes (SEM) limits the temporal resolution required for the study of ultrafast dynamics of materials surfaces. Here, we report the development of scanning ultrafast electron microscopy (S.UEM) as a time-resolved method with resolut...
| Publicado en: | Journal of the American Chemical Society Vol. 133; no. 20; pp. 7708 - 7712 |
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| Autores principales: | , , , |
| Formato: | Artículo |
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American Chemical Society
5/25/2011
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| Materias: | |
| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=61820373&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 61820373 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00027863 ACS jtl: Journal of the American Chemical Society issn: 00027863 maglogo: N pubinfo: dt: 5/25/2011 vid: 133 iid: 20 pid: 997 pub: American Chemical Society artinfo: ui: 61820373 10.1021/ja2031322 ppf: 7708 ppct: 4 formats: tig: atl: 4D Scanning Ultrafast Electron Microscopy: Visualization of Materials Surface Dynamics. aug: au: Mohammed, Omar F. Ding-Shyue Yang Samir Kumar Pal Ahmed H. Zewail affil: Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, California 91125, United States Department of CBMS, UNANST, S.N. Bose National Center for Basic Sciences, Kolkata 700 098, India su: Electron beam research Scanning electron microscopes Electron microscopy Time-resolved spectroscopy Electron diffraction Electron backscattering Imaging systems in chemistry sug: subj: Electron beam research Scanning electron microscopes Electron microscopy Time-resolved spectroscopy Electron diffraction Electron backscattering Imaging systems in chemistry ab: The continuous electron beam of conventional scanning electron microscopes (SEM) limits the temporal resolution required for the study of ultrafast dynamics of materials surfaces. Here, we report the development of scanning ultrafast electron microscopy (S.UEM) as a time-resolved method with resolutions in both space and time. The approach is demonstrated in the investigation of the dynamics of semiconducting and metallic materials visualized using secondary-electron images and backscattering electron diffraction patterns. For probing, the electron packet was photogenerated from the sharp field-emitter tip of the microscope with a very low number of electrons in order to suppress space-charge repulsion between electrons and reach the ultrashort temporal resolution, an improvement of orders of magnitude when compared to the traditional beam-blanking method. Moreover, the spa- tial resolution of SEM is maintained, thus enabling spatio-temporal visualization of surface dynamics following the initiation of change by femtosecond heating or excitation. We discuss capabilities and potential applications of S-UEM in materials and biological science. pubtype: Academic Journal doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2011 holdings: @attributes: islocal: N |
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