4D Scanning Ultrafast Electron Microscopy: Visualization of Materials Surface Dynamics.

The continuous electron beam of conventional scanning electron microscopes (SEM) limits the temporal resolution required for the study of ultrafast dynamics of materials surfaces. Here, we report the development of scanning ultrafast electron microscopy (S.UEM) as a time-resolved method with resolut...

Descripción completa

Detalles Bibliográficos

Publicado en:	Journal of the American Chemical Society Vol. 133; no. 20; pp. 7708 - 7712
Autores principales:	Mohammed, Omar F., Ding-Shyue Yang, Samir Kumar Pal, Ahmed H. Zewail
Formato:	Artículo
Publicado:	American Chemical Society 5/25/2011
Materias:	Electron beam research Scanning electron microscopes Electron microscopy Time-resolved spectroscopy Electron diffraction Electron backscattering Imaging systems in chemistry
Acceso en línea:	Ver este registro en EBSCOhost