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An optimal rule for patent damages under sequential innovation.

Abstract: We analyze the optimal design of damages for patent infringement when a follow‐on innovator may infringe the patent of an initial innovator. We consider damage rules that are linear combinations of the popular “lost profit” (LP) and “unjust enrichment” (UE) rules, coupled with a lump‐sum t...

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Published in:RAND Journal of Economics (Wiley-Blackwell) Vol. 49; no. 2; pp. 370 - 398
Main Authors: Chen, Yongmin, Sappington, David E. M.
Format: Article
Published: Wiley-Blackwell Summer2018
Subjects:
Technological innovations
Patent infringement
Unjust enrichment
Lost profits damages
Patent law
Online Access:View this record in EBSCOhost