An optimal rule for patent damages under sequential innovation.

Abstract: We analyze the optimal design of damages for patent infringement when a follow‐on innovator may infringe the patent of an initial innovator. We consider damage rules that are linear combinations of the popular “lost profit” (LP) and “unjust enrichment” (UE) rules, coupled with a lump‐sum t...

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Publicado en:	RAND Journal of Economics (Wiley-Blackwell) Vol. 49; no. 2; pp. 370 - 398
Autores principales:	Chen, Yongmin, Sappington, David E. M.
Formato:	Artículo
Publicado:	Wiley-Blackwell Summer2018
Materias:	Technological innovations Patent infringement Unjust enrichment Lost profits damages Patent law
Acceso en línea:	Ver este registro en EBSCOhost