USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.

A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crys...

Full description

Bibliographic Details

Published in:	Revista Cubana de Física Vol. 41; no. 1; pp. 16 - 22
Main Authors:	RODRÍGUEZ-HERRERA, D. M., PENTON-MADRIGAI, A., ESTEVEZ-RAMS, E.
Format:	Article
Published:	Universidad de La Habana 7/15/2024
Subjects:	Crystal structure Diffraction patterns Set functions X-ray diffraction
Online Access:	View this record in EBSCOhost