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Automating Postsilicon Debugging and Repair.

The article examines an automated process for the postsilicon error detection and verification of semiconductors in the integrated circuit manufacturing process. Due to the increasing complexity of semiconductor design, debugging has become the most time-consuming part of the manufacturing process,...

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Publicado en:Computer (00189162) Vol. 41; no. 7; pp. 47 - 55
Autores principales: Kai-Hui Chang, Markov, Igor L., Bertacco, Valeria
Formato: Artículo
Publicado: IEEE Jul2008
Materias:
Reduced instruction set computers
Solid state electronics
Semiconductor software
Semiconductor defects
Semiconductors testing
Integrated circuit verification
Acceso en línea:Ver este registro en EBSCOhost
Sumario:The article examines an automated process for the postsilicon error detection and verification of semiconductors in the integrated circuit manufacturing process. Due to the increasing complexity of semiconductor design, debugging has become the most time-consuming part of the manufacturing process, a particular problem due to the time-sensitive nature of the product. The methodology of the automated process is given.