Statistical Analysis of Circuit Timing Using Majorization.
Future miniaturization of silicon transistors following Moore's Law may be in jeopardy as it becomes harder to precisely define the behavior and shape of nanoscale transistors. One fundamental challenge is overcoming the variability in key integrated circuit parameters. In this paper, we discuss the...
| Publicado en: | Communications of the ACM Vol. 52; no. 8; pp. 95 - 101 |
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| Autores principales: | , |
| Formato: | Artículo |
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Association for Computing Machinery
Aug2009
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| Acceso en línea: | Ver este registro en EBSCOhost |
| fields | @attributes: recordID: 1 pdfLink: plink: https://search.ebscohost.com/login.aspx?direct=true&db=hlh&AN=43479969&site=ehost-live header: @attributes: shortDbName: hlh uiTerm: 43479969 longDbName: Humanities International Complete uiTag: AN controlInfo: bkinfo: jinfo: jid: 00010782 ACM jtl: Communications of the ACM issn: 00010782 maglogo: N pubinfo: dt: Aug2009 vid: 52 iid: 8 pid: 68 pub: Association for Computing Machinery artinfo: ui: 43479969 10.1145/1536616.1536641 ppf: 95 ppct: 6 formats: tig: atl: Statistical Analysis of Circuit Timing Using Majorization. aug: au: Orshansky, Michael Wei-Shen Wang affil: Department of ECE, University of Texas, Austin. su: Integrated circuits Computer reliability Computer circuits Computers Distribution (Probability theory) Statistics sug: subj: Integrated circuits Computer reliability Computer circuits Computers Distribution (Probability theory) Statistics ab: Future miniaturization of silicon transistors following Moore's Law may be in jeopardy as it becomes harder to precisely define the behavior and shape of nanoscale transistors. One fundamental challenge is overcoming the variability in key integrated circuit parameters. In this paper, we discuss the development of electronic design automation tools that predict the impact of process variability on circuit behavior, with particular emphasis on verifying timing correctness. We present a new analytical technique for solving the central mathematical challenge of the statistical formulation of timing analysis which is the computation of the circuit delay distribution when delays of circuit elements are correlated. Our approach derives the bounds for the exact distribution using the theory of stochastic majorization. Across the benchmarks, the root-mean-square difference between the exact distribution and the bounds is 1.7-4.5% for the lower bound and 0.9-6.2% for the upper bound. pubtype: Periodical doctype: Article src: R language: English refInfo: copyright: @attributes: flag: Y dt: @attributes: year: 2009 holdings: @attributes: islocal: N |
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