Statistical Analysis of Circuit Timing Using Majorization.

Future miniaturization of silicon transistors following Moore's Law may be in jeopardy as it becomes harder to precisely define the behavior and shape of nanoscale transistors. One fundamental challenge is overcoming the variability in key integrated circuit parameters. In this paper, we discuss the...

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Bibliographic Details

Published in:	Communications of the ACM Vol. 52; no. 8; pp. 95 - 101
Main Authors:	Orshansky, Michael, Wei-Shen Wang
Format:	Article
Published:	Association for Computing Machinery Aug2009
Subjects:	Integrated circuits Computer reliability Computer circuits Computers Distribution (Probability theory) Statistics
Online Access:	View this record in EBSCOhost